Wuhan Precise Instrument Co., Ltd.
Quality Unità di misura di fonte, Misuratore di sorgente a doppio canale supplier from China.
Feb 17, 2025
With Source Measure Unit as the Core,Focusing on Power Semiconductor Testing
Pragmatic
Reliable
Economic
Compatible
Intelligent
Standard
Exciting
Learn More →
Pragmatic
Reliable
Economic
Compatible
Intelligent
Standard
Exciting
Source Measure Unit
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00:24
![S300 DC Source Measure Unit 300V/1A for Electrical Characteristic Testing]( "S300 DC Source Measure Unit 300V/1A for Electrical Characteristic Testing")
S300 DC Source Measure Unit 300V/1A for Electrical Characteristic Testing
Feb 24, 2025 -
00:24
![300V/3A Semiconductor Testing DC Source Measure Unit S300B]( "300V/3A Semiconductor Testing DC Source Measure Unit S300B")
300V/3A Semiconductor Testing DC Source Measure Unit S300B
Feb 24, 2025 -
00:24
![30V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P100]( "30V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P100")
30V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P100
Feb 24, 2025 -
00:24
![100V/1A/10A Pulse Source Meter P200 for Characterizing Semiconductors]( "100V/1A/10A Pulse Source Meter P200 for Characterizing Semiconductors")
100V/1A/10A Pulse Source Meter P200 for Characterizing Semiconductors
Feb 24, 2025 -
00:24
![300V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P300]( "300V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P300")
300V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P300
Feb 24, 2025 -
00:24
![300V/4A/30A Pulse Source Measure Unit P300B for Semiconductors and Materials]( "300V/4A/30A Pulse Source Measure Unit P300B for Semiconductors and Materials")
300V/4A/30A Pulse Source Measure Unit P300B for Semiconductors and Materials
Feb 24, 2025 -
00:24
![High Current Pulse Source Measure Unit HCP100 with Max Pulse Output Current 30A and Max Output Voltage 50V]( "High Current Pulse Source Measure Unit HCP100 with Max Pulse Output Current 30A and Max Output Voltage 50V")
High Current Pulse Source Measure Unit HCP100 with Max Pulse Output Current 30A and Max Output Voltage 50V
Feb 24, 2025 -
00:25
![100V/100A High Current Pulse Source Measure Unit HCP300 for IGBT]( "100V/100A High Current Pulse Source Measure Unit HCP300 for IGBT")
100V/100A High Current Pulse Source Measure Unit HCP300 for IGBT
Feb 24, 2025
Recent Videos
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01:24
![PRECISE Instrument | Source of Exploration Internal and External Consistency]( "PRECISE Instrument | Source of Exploration Internal and External Consistency")
PRECISE Instrument | Source of Exploration Internal and External Consistency
Feb 17, 2025 -
00:34
![LDBI Multi-Channel High-Power Laser Aging System]( "LDBI Multi-Channel High-Power Laser Aging System")
LDBI Multi-Channel High-Power Laser Aging System
Feb 26, 2025 -
00:24
![1000A Current Sensor Test System CTMS]( "1000A Current Sensor Test System CTMS")
1000A Current Sensor Test System CTMS
Feb 26, 2025 -
00:30
![10kV/6000A Power Device Analyzer Static Test System PMST For MOSFET BJT IGBT And SiC GaN Semiconductors]( "10kV/6000A Power Device Analyzer Static Test System PMST For MOSFET BJT IGBT And SiC GaN Semiconductors")
10kV/6000A Power Device Analyzer Static Test System PMST For MOSFET BJT IGBT And SiC GaN Semiconductors
Feb 26, 2025 -
00:36
![1200V/100A Semiconductor Parameter Analyzer SPA6100]( "1200V/100A Semiconductor Parameter Analyzer SPA6100")
1200V/100A Semiconductor Parameter Analyzer SPA6100
Feb 26, 2025 -
00:27
![2 MS/s Multi-channel Data Acquisition Card A400B Board High Speed]( "2 MS/s Multi-channel Data Acquisition Card A400B Board High Speed")
2 MS/s Multi-channel Data Acquisition Card A400B Board High Speed
Feb 26, 2025 -
00:24
![A400 Data Acquisition Card with 16-bit ADC Resolution and 1MS/s Sampling Rate]( "A400 Data Acquisition Card with 16-bit ADC Resolution and 1MS/s Sampling Rate")
A400 Data Acquisition Card with 16-bit ADC Resolution and 1MS/s Sampling Rate
Feb 26, 2025
Popular Videos
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01:24
![PRECISE Instrument | Source of Exploration Internal and External Consistency]( "PRECISE Instrument | Source of Exploration Internal and External Consistency")
PRECISE Instrument | Source of Exploration Internal and External Consistency
Feb 17, 2025 -
00:36
![30V/1A Semiconductor Electrical Characteristics Testing DC Source Measure Unit S100]( "30V/1A Semiconductor Electrical Characteristics Testing DC Source Measure Unit S100")
30V/1A Semiconductor Electrical Characteristics Testing DC Source Measure Unit S100
Feb 24, 2025 -
00:34
![LDBI Multi-Channel High-Power Laser Aging System]( "LDBI Multi-Channel High-Power Laser Aging System")
LDBI Multi-Channel High-Power Laser Aging System
Feb 26, 2025 -
00:24
![300A/30V High Current Pulse Power Supply HCPL030 For SiC/IGBT/GaN HEMT Test]( "300A/30V High Current Pulse Power Supply HCPL030 For SiC/IGBT/GaN HEMT Test")
300A/30V High Current Pulse Power Supply HCPL030 For SiC/IGBT/GaN HEMT Test
Feb 25, 2025 -
00:24
![1200V/100mA High Voltage Power Source for IGBT Breakdown Voltage Test]( "1200V/100mA High Voltage Power Source for IGBT Breakdown Voltage Test")
1200V/100mA High Voltage Power Source for IGBT Breakdown Voltage Test
Feb 25, 2025 -
00:24
![1000A/18V High Current Pulse Power Supply HCPL100 For SiC/IGBT/GaN HEMT Test]( "1000A/18V High Current Pulse Power Supply HCPL100 For SiC/IGBT/GaN HEMT Test")
1000A/18V High Current Pulse Power Supply HCPL100 For SiC/IGBT/GaN HEMT Test
Feb 25, 2025 -
00:24
![300V/30A Dual Channel Source Meter DP300B for Various Electrical Characteristic Tests]( "300V/30A Dual Channel Source Meter DP300B for Various Electrical Characteristic Tests")
300V/30A Dual Channel Source Meter DP300B for Various Electrical Characteristic Tests
Feb 24, 2025
