Sistemi di prova dei semiconduttori
(5)
LDBI Laser Aging Semiconductor Test Systems Sistema di prova multicanale
Prezzo: Negotiable
MOQ: 1 unit
Tempo di consegna: 2-8 weeks
Marca: PRECISE INSTRUMENT
Evidenziare:Laser Aging Semiconductor Test Systems, LDBI Semiconductor Test Systems, Multi Channel Power Device Analyzer
LDBI Laser Aging Semiconductor Test Systems Multi Channel Testing System LDBI multi-channel high-power laser aging system is specifically designed to address the issues of kilowatt-level high-power semiconductor laser chips and pump laser modules that require narrow pulse high current testing and ag... Visualizza di più
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1200V/100A Analisatore di parametri dei semiconduttori SPA6100
Prezzo: Negotiable
MOQ: 1 unit
Tempo di consegna: 2-8 weeks
Marca: PRECISE INSTRUMENT
Evidenziare:1200V/100A Semiconductor Parameter Analyzer, SPA6100 Semiconductor Test Systems, SPA6100 Semiconductor Parameter Analyzer
1200V/100A Semiconductor Parameter Analyzer SPA6100 Semiconductor Test Systems The SPA6100 Semiconductor Parameter Analyzer offers advantages including high precision, wide measurement range, rapid flexibility, and strong compatibility. This product supports simultaneous testing of DC current-voltag... Visualizza di più
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10kV/6000A Analisi statica del dispositivo di alimentazione PMST Per Mosfet BJT IGBT SiC GaN Semiconduttore
Prezzo: Negotiable
MOQ: 1 unit
Tempo di consegna: 2-8 weeks
Marca: PRECISE INSTRUMENT
Evidenziare:10kV/6000A Power Device Analyzer, Analyzer Static Test PMST, BJT IGBT Power Device Analyzer
10kV/6000A Power Device Analyzer Static Test PMST For MOSFET BJT IGBT And SiC GaN Semiconductors PMST Static Parameter Test System for Power Devices integrates multiple measurement and analysis functions, enabling precise testing of static parameters for various power devices (e.g., MOSFETs, BJTs, I... Visualizza di più
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Sistema di prova C-V per dispositivi semiconduttori 10 Hz-1 MHz
Prezzo: Negotiable
MOQ: 1 unit
Tempo di consegna: 2-8 weeks
Marca: PRECISE INSTRUMENT
Evidenziare:1MHz Semiconductor Power Device, 10Hz Semiconductor Power Device, C-V Semiconductor Characterization System
10Hz-1MHz Semiconductor Device C-V Testing System Capacitance-Voltage (C-V) Measurement is widely used to characterize semiconductor parameters, particularly in MOS capacitors (MOS CAPs) and MOSFET structures. The capacitance of a metal-oxide-semiconductor (MOS) structure is a function of the applie... Visualizza di più
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1000A Sistema di prova del sensore di corrente CTMS Attrezzatura di prova dei semiconduttori
Prezzo: Negotiable
MOQ: 1 unit
Tempo di consegna: 2-8 weeks
Marca: PRECISE INSTRUMENT
Evidenziare:1000A Current Sensor Test System, CTMS Semiconductor Testing Equipment, 1000A CTMS Semiconductor Testing
1000A Current Sensor Test System CTMS Semiconductor Testing Equipment CTMS test system integrates a variety of measurement and analysis functions, and can accurately measure the static and dynamic parameters of various current sensors (Hall current sensors, Rogowski coils, Pilsner coils, etc.), with... Visualizza di più
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